Título

A method to estimate the reliability of FPGA-based architectures for space systems

Autor

JUAN ANDRES PEREZ CELIS

Colaborador

RENE ARMANDO CUMPLIDO PARRA (Asesor de tesis)

Nivel de Acceso

Acceso Abierto

Resumen o descripción

The use of Static Random-Access Memory (SRAM)-based Field Programmable Gate

Arrays (FPGAs) in space systems is gaining a growing interest. The high-computational

power, the ability to reconfigure and the flexibility of FPGAs at low power make them

suitable devices for space applications. Nevertheless, FPGAs are susceptible to Single

Event Upsets which may cause an operational failure, leading to a decrease of the

reliability. Fault Mitigation Techniques (FMT) are used to increase the reliability,

making the architecture suitable for operating in the space. However, estimating the

reliability of a FPGA design can be challenging. The preferred method consists of

placing the FPGA under a high-energy particle beam and performing the test iteratively

to estimate the reliability. The iterative process makes radiation testing prohibitive for

many space applications, as the monetary cost and time spent for radiation testing is

extremely high.

This thesis proposes a method for determining the reliability of an FPGA

architecture with FMTs applied based on the failure rate of an unmitigated design.

The method uses Markov chains to model the architecture and estimate the reliability.

An unmitigated design and a mitigated design were developed and placed under a

neutron beam to estimate the reliability. The mitigated design decreases the sensible

area, i.e. increases the reliability, by a factor of 20:18. The mitigated design is a

triplication of the mitigated design with additional voters placed throughout the

architecture. Two models resembling the behavior of the mitigated design with a

Medium Grain Triple Modular Redundancy (MGTMR) are proposed. The difference

of the models lies in the addition of shared-resources modules. The results of the

models show that the estimation of reliability is close to that obtained through

neutron testing.

Editor

Instituto Nacional de Astrofísica, Óptica y Electrónica

Fecha de publicación

agosto de 2016

Tipo de publicación

Tesis de maestría

Versión de la publicación

Versión aceptada

Formato

application/pdf

Idioma

Inglés

Audiencia

Estudiantes

Investigadores

Público en general

Sugerencia de citación

Perez-Celis J.A.

Repositorio Orígen

Repositorio Institucional del INAOE

Descargas

580

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