Título

Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion

Autor

JULIO CESAR VAZQUEZ HERNANDEZ

Víctor Hugo Champac Vilela

Nivel de Acceso

Acceso Abierto

Licencia

http://creativecommons.org/licenses/by-nc-nd/4.0

Materias

Aging sensors - (INSPEC) Error prediction - (INSPEC) Nanometer technologies - (INSPEC) Process variations - (INSPEC) Reliability - (INSPEC) CIENCIAS FÍSICO MATEMÁTICAS Y CIENCIAS DE LA TIERRA - (CTI) FÍSICA - (CTI) ELECTRÓNICA - (CTI) ELECTRÓNICA - (CTI)

Resumen o descripción

As process technology continues to shrink, Process Variations and Aging effects have an increasing impact on the reliability and performance of manufactured circuits. Aging effects, namely due to Negative Bias Temperature Instability (NBTI) produce performance degradation as time progresses. This degradation rate depends on a) Operational conditions (e.g., VDD, Temperature and time of electrical stress on MOS transistors) and b) Static technological parameters defined in the fabrication process. Moreover, performance of electronic systems for safety-critical applications which operate for many years in harsh environments are more prompt to be impacted by aging. In order to guarantee a safe operation in advanced technologies, aging monitoring should be performed on chip using built-in aging sensors. The purpose of this work is to present a methodology to determine the correct location for aging sensor insertion, considering the combined impact of process variations (PV) and aging effects (namely due to NBTI). In order to implement the methodology, a path-based statistical timing analysis framework and tools have been developed. It is shown that delay path reordering, associated with PV and aging, may justify the insertion of a few additional sensors, to cover abnormal delays of signal paths that become critical, under long system operation (e.g., 10 years).

Editor

Journal of Electronic Testing

Fecha de publicación

3 de marzo de 2013

Tipo de publicación

Artículo

Versión de la publicación

Versión aceptada

Recurso de información

http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/2281

Formato

application/pdf

Idioma

Inglés

Audiencia

Estudiantes

Investigadores

Público en general

Sugerencia de citación

Vazquez, J. C., et al., (2013), Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion, Journal of Electronic Testing, Vol. 29(3):289-299

Repositorio Orígen

Repositorio Institucional del INAOE

Descargas

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