Título

Noise in micro-bolometers with silicon-germanium thermo-sensing layer

Autor

ANDREY KOSAREV

MARIO MORENO MORENO

ALFONSO TORRES JACOME

Sergey N. Rumyantsev

ISMAEL COSME BOLAÑOS

Nivel de Acceso

Acceso Abierto

Resumen o descripción

Low frequency noise in a-SixGey:H thermo-sensing films, on glass and in micro-bolometers of planar and sandwich structures based on the same material has been studied at different temperatures. The noise spectra had the form of the 1/f-like noise with the frequency exponent within the range of 0.8 to 1.6 depending on the sample and temperature. In the temperature range from T = 340 to 400 K the amplitude of the noise and current (at constant voltage) increased. These dependences can be described as a thermal activated process with energies of EaS/I = 0.63 eV and Eafilm = 0.34 eV for relative spectral noise density of the current fluctuations and DC current, respectively.

Editor

Elsevier B.V.

Fecha de publicación

2010

Tipo de publicación

Artículo

Versión de la publicación

Versión aceptada

Formato

application/pdf

Idioma

Inglés

Audiencia

Estudiantes

Investigadores

Público en general

Sugerencia de citación

Kosarev, A., et al., (2010). Noise in micro-bolometers with silicon-germanium thermo-sensing layer, Thin Solid Films, (518): 3310–3312

Repositorio Orígen

Repositorio Institucional del INAOE

Descargas

367

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